Techniques for Sequential Circuit Automatic Test Generation

Niermann, Thomas Michael

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https://hdl.handle.net/2142/88648 Copy

Description

Title

Techniques for Sequential Circuit Automatic Test Generation

Author(s)

Niermann, Thomas Michael

Issue Date

1991-03

Keyword(s)

• Test pattern generation
• Fault simulation
• Algorithms
• Reliability

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-91-2214, CRHC-91-8

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88648

Sponsor(s)/Grant Number(s)

Semiconductor Research Corp. / 90-DP-109

Owning Collections