Automatic Test Generation for Bit-serial VLSI Digital Signal Processors

Roy, Rabindra Kumar

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https://hdl.handle.net/2142/88654 Copy

Description

Title

Automatic Test Generation for Bit-serial VLSI Digital Signal Processors

Author(s)

Roy, Rabindra Kumar

Issue Date

1992-02

Keyword(s)

• Signal processing
• VLSI
• Hierarchical testing
• Test generation
• Bit-serial architecture

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-92-2208, CRHC-92-05

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88654

Sponsor(s)/Grant Number(s)

• Semiconductor Research Corporation
• General Electric / expired gift

Owning Collections