University of Illinois Urbana-Champaign

An Accurate Timing Model for Fault Simulation in MOS Circuits

Kim, Sungho

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https://hdl.handle.net/2142/75281

Description

Title
An Accurate Timing Model for Fault Simulation in MOS Circuits
Author(s)
Kim, Sungho
Issue Date
1989-09
Keyword(s)
  • Fault simulation
  • MOS circuits
  • Delay fault testing
  • Timing model
  • SPICE
  • RSIM
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-89-2229, CSG-106
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75281
Sponsor(s)/Grant Number(s)
  • Semiconductor Research Corporation / 88-DP-109
  • Joint Services Electronics Program / N00014-84-C-0149

Owning Collections

Report - Coordinated Science Laboratory PRIMARY