Testing and Fault-Tolerance Aspect of High Density VLSI Memory

Mazumder, Pinaki

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https://hdl.handle.net/2142/88601 Copy

Description

Title

Testing and Fault-Tolerance Aspect of High Density VLSI Memory

Author(s)

Mazumder, Pinaki

Issue Date

1988-01

Keyword(s)

• Parallel testing
• Fault tolerance
• On-line fault detection
• Testability
• VLSI memory

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-88-2206, CSG-81

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88601

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation / 87-DP-109

Owning Collections