Use of High-level Descriptions in Fault Simulation and Test Generation

Chang, Hong-Tao Paul

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https://hdl.handle.net/2142/88598 Copy

Description

Title

Use of High-level Descriptions in Fault Simulation and Test Generation

Author(s)

Chang, Hong-Tao Paul

Issue Date

1987-09

Keyword(s)

• Fault simulation
• Test generation
• Functional descriptions
• Logic simulation

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-87-2259, CSG-72

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88598

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation, 86-12-109 (SRC)

Owning Collections