Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI

Chang, Ming-Feng

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https://hdl.handle.net/2142/88644 Copy

Description

Title

Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI

Author(s)

Chang, Ming-Feng

Issue Date

1991-01

Keyword(s)

• Defect-tolerant design
• Memory diagnosis
• Reconfiguration
• Optimal testing
• K-out-of-n systems

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-91-2203, CRHC-91-1

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88644

Sponsor(s)/Grant Number(s)

• Semiconductor Research Corporation (SRC) / 90-DP-109
• Ministry of Education, Republic of China

Owning Collections