Test Generation for Microprocessors

Thatte, Satish Mukund

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https://hdl.handle.net/2142/75644 Copy

Description

Title

Test Generation for Microprocessors

Author(s)

Thatte, Satish Mukund

Issue Date

1979-05

Keyword(s)

• Microprocessor architecture
• Architecture models
• Functional level fault models
• Test programs
• Complexity of tests

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG 78-2235, R-842

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/75644

Sponsor(s)/Grant Number(s)

Joint Services Electronics Program / DAAB-07-72-C-0259, DAAG-29-78-C-0016, and N00014-79-C-0424

Owning Collections