Statistical Design of MOS VLSI Circuits with Designed Experiments

Yu, Tat-Kwan Edgar

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https://hdl.handle.net/2142/88618 Copy

Description

Title

Statistical Design of MOS VLSI Circuits with Designed Experiments

Author(s)

Yu, Tat-Kwan Edgar

Issue Date

1990-03

Keyword(s)

• Statistical design
• VLSI design
• Experimental design

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-90-2208, DAC-18

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88618

Sponsor(s)/Grant Number(s)

• Joint Services Electronics Program / N00014-84-C-0149
• Semiconductor Research Corporation
• AT&T Bell Laboratories

Owning Collections