High-Level Testability Analysis and Enhancement for Digital Systems

Hsu, Frank Fu-Chang

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https://hdl.handle.net/2142/88511 Copy

Description

Title

High-Level Testability Analysis and Enhancement for Digital Systems

Author(s)

Hsu, Frank Fu-Chang

Issue Date

1998-07

Keyword(s)

• Design for testability
• Test synthesis
• Behavioral modification
• Partial scan
• Variable selection

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-98-2216, CRHC-98-07

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88511

Sponsor(s)/Grant Number(s)

Semiconductor Research Corp. / 97-DJ-482

Owning Collections