University of Illinois Urbana-Champaign

Modeling and Extraction of Interconnect Parameters in Very-Large-Scale Integrated Circuits

Yuan, Chen-Ping

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https://hdl.handle.net/2142/75678

Description

Title
Modeling and Extraction of Interconnect Parameters in Very-Large-Scale Integrated Circuits
Author(s)
Yuan, Chen-Ping
Issue Date
1983-08
Keyword(s)
  • Very large scale integrated circuits
  • Extraction of circuit from layout
  • Electrical models for interconnect circuit
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG 83-2215, R-994
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75678
Sponsor(s)/Grant Number(s)
  • Joint Services Electronics Program / N00014-79-C-0424
  • IBM Corporation

Owning Collections

Report - Coordinated Science Laboratory PRIMARY