Enhancement of the Illinois Scan Architecture for Multiple Scan Inputs and Transition Faults

Shah, Mihir Atul

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https://hdl.handle.net/2142/75480 Copy

Description

Title

Enhancement of the Illinois Scan Architecture for Multiple Scan Inputs and Transition Faults

Author(s)

Shah, Mihir Atul

Issue Date

2003-09

Keyword(s)

• ILS
• Shared scan-in
• Multiple groups
• Transition fault

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-03-2218, CRHC-03-09

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/75480

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation / SRC 99-TJ-717

Owning Collections