University of Illinois Urbana-Champaign

Impact of Device Level Faults in a Digital Avionic Processor

Kim, Suk Ho

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https://hdl.handle.net/2142/75336

Description

Title
Impact of Device Level Faults in a Digital Avionic Processor
Author(s)
Kim, Suk Ho
Issue Date
1989-01
Keyword(s)
  • Fault injection
  • Fault propagation
  • Device level fault
  • Device-level fault
  • Mixed mode simulation
  • Mean Error Durations
  • Mean Time Between Errors
  • Near-coincident errors
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-89-2210, CSG-99
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75336
Sponsor(s)/Grant Number(s)
NASA: NAG 1-602

Owning Collections

Report - Coordinated Science Laboratory PRIMARY