The Derivation of Analytical Design Equations for Built-In Current Sensors for Use in Iddq Testing
Greve, David Arthur
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https://hdl.handle.net/2142/75373
Description
Title
The Derivation of Analytical Design Equations for Built-In Current Sensors for Use in Iddq Testing
Author(s)
Greve, David Arthur
Issue Date
1993-11
Keyword(s)
Iddq testing
CMOS circuit faults
Built-in current sensor
Quiescent current
Bridging faults
Publisher
Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
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