University of Illinois Urbana-Champaign

Fault Ordering in Sequential Automatic Test Pattern Generation

Heydinger, Scott Michael

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https://hdl.handle.net/2142/75401

Description

Title
Fault Ordering in Sequential Automatic Test Pattern Generation
Author(s)
Heydinger, Scott Michael
Issue Date
1993-01
Keyword(s)
  • Test pattern generation
  • Faults
  • Sequential circuits
  • ATG
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-93-2202, CRHC-93-02
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75401
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation

Owning Collections

Report - Coordinated Science Laboratory PRIMARY