University of Illinois Urbana-Champaign

High Level Test Generation Using Software Testing Metrics

Johnson, Mark Willard

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https://hdl.handle.net/2142/75413

Description

Title
High Level Test Generation Using Software Testing Metrics
Author(s)
Johnson, Mark Willard
Issue Date
1995-02
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-95-2204, CRHC-95-06
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75413
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation

Owning Collections

Report - Coordinated Science Laboratory PRIMARY