University of Illinois Urbana-Champaign

Sequential Circuit Test Generation Using Genetic Techniques

Hsiao, Michael Shaun

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https://hdl.handle.net/2142/88503

Description

Title
Sequential Circuit Test Generation Using Genetic Techniques
Author(s)
Hsiao, Michael Shaun
Issue Date
1997-05
Keyword(s)
  • Test generation
  • Genetic algorithms
  • Test set compaction
  • Finite state machine
  • Dynamic state traversal
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-97-2213, CRHC-97-09
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88503
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation / 96-DP-109

Owning Collections

Report - Coordinated Science Laboratory PRIMARY