An FPGA Based Testbench for Reliability and Endurance Characterization of Nonvolatile Memory

Rao, Vikram M.N.

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https://hdl.handle.net/2142/75473 Copy

Description

Title

An FPGA Based Testbench for Reliability and Endurance Characterization of Nonvolatile Memory

Author(s)

Rao, Vikram M.N.

Issue Date

2002-05

Keyword(s)

• Memory test
• Ferrowelectric
• Ferroelectric
• EEPROM
• FPGA
• Verilog

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-02-2204, CRHC-02-04

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/75473

Sponsor(s)/Grant Number(s)

Jet Propulsion Laboratory / JPL 122991

Owning Collections