University of Illinois Urbana-Champaign

Diagnosis of Delay Faults in Sequential Circuits

Sunder, Srinivas

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https://hdl.handle.net/2142/75412

Description

Title
Diagnosis of Delay Faults in Sequential Circuits
Author(s)
Sunder, Srinivas
Issue Date
1995-01
Keyword(s)
  • Slow testing
  • At-speed testing
  • SFCSO
  • MFCSO
  • MFCMO
  • Critical path-tracing
  • Backtracing
  • Fault activation
  • Fault propagation
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-95-2202, CRHC-95-02
Type of Resource
text
Language
English
Permalink
http://hdl.handle.net/2142/75412
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation

Owning Collections

Report - Coordinated Science Laboratory PRIMARY