A Simulation and Redesign System for Circuit Hot-Carrier Reliability

Li, Ping-Chung

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https://hdl.handle.net/2142/88627 Copy

Description

Title

A Simulation and Redesign System for Circuit Hot-Carrier Reliability

Author(s)

Li, Ping-Chung

Issue Date

1994-05

Keyword(s)

• Hot-carrier
• Reliability
• Probabilistic simulation
• VLSI circuits
• Current estimation
• Design for reliability

Publisher

Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88627

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059

Owning Collections