State Information-Based Solutions for Sequential Circuit Diagnosis and Testing

Boppana, Vamsi

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https://hdl.handle.net/2142/88509 Copy

Description

Title

State Information-Based Solutions for Sequential Circuit Diagnosis and Testing

Author(s)

Boppana, Vamsi

Issue Date

1997-12

Keyword(s)

• Diagnosis
• Indistinguishability
• DATPG
• Partial scan
• Untestability
• Fault location

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-97-2235, CRHC-97-20

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88509

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation, 96-DP-109

Owning Collections