Fault Diagnosis of Semiconductor Random Access Memories

Thatte, Satish Mukund

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https://hdl.handle.net/2142/75169 Copy

Description

Title

Fault Diagnosis of Semiconductor Random Access Memories

Author(s)

Thatte, Satish Mukund

Issue Date

1977-05

Keyword(s)

• Semiconductor random access memories
• Functional testing
• Pattern sensitivity testing

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG 77-2216, R-769

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/75169

Sponsor(s)/Grant Number(s)

Joint Services Electronics Program / DAAB-07-72-C-0259

Owning Collections