Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits

Kriplani, Harish

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https://hdl.handle.net/2142/88626 Copy

Description

Title

Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits

Author(s)

Kriplani, Harish

Issue Date

1993-11

Keyword(s)

• Voltage drop
• CMOS circuits
• VLSI circuit reliability
• Power and ground buses
• Maximum current

Publisher

Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-93-2248, DAC-43

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88626

Sponsor(s)/Grant Number(s)

Texas Instruments Inc., the Semiconductor Research Corporation (SRC), and USAF / 92-DP-109 and F30602-92-C-0059

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