Compressed and Dynamic Fault Dictionaries for Fault Isolation

Ryan, Paul George

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https://hdl.handle.net/2142/88480 Copy

Description

Title

Compressed and Dynamic Fault Dictionaries for Fault Isolation

Author(s)

Ryan, Paul George

Issue Date

1994-09

Keyword(s)

• VLSI
• Dictionary formats
• Compression algorithms
• Single-fall fault simulation

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-94-2234, CRHC-94-19

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88480

Sponsor(s)/Grant Number(s)

• Semiconductor Research Corporation / 93-DP-109
• Intel Corporation
• Joint Services Electronics Program / N00014-90-J-1270

Owning Collections