Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation

Krishnaswamy, Dilip

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https://hdl.handle.net/2142/88505 Copy

Description

Title

Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation

Author(s)

Krishnaswamy, Dilip

Issue Date

1997-09

Keyword(s)

• Parallel genetic algorithms
• Simulation-based parallel test generation
• Test set
• Sequence partitioning
• Synchronous and asynchronous parallel algorithms
• Parallel fault simulation

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-97-2221, CRHC-97-14

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/88505

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation and ARPA / 96-DP-109 and DAAH04-94-G0273

Owning Collections