Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing

Lumetta, Steven S.

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https://hdl.handle.net/2142/74592 Copy

Description

Title

Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing

Author(s)

Lumetta, Steven S.

Issue Date

2006-07

Keyword(s)

• Scan test
• X-tolerance
• Test response compaction
• Diagnosis

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-06-2214, CRHC-06-10

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/74592

Sponsor(s)/Grant Number(s)

• National Science Foundation / ACI-99-84492 CAREER
• Intel Corporation

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