Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory

Mazumder, Pinaki; Patel, Janak H.

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https://hdl.handle.net/2142/74381 Copy

Description

Title

Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory

Author(s)

• Mazumder, Pinaki
• Patel, Janak H.

Issue Date

1986-08

Keyword(s)

• RAM
• Passive neighborhood pattern sensitive fault
• Active neighborhood pattern sensitive fault
• Bit lines
• Word lines
• Sense amplifiers

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-86-2232, CSG-56

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/74381

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation / SRC RSCH 84-06-049-4

Owning Collections