Tunneling Measurement of Electron-Plasmon Interactions in Degenerate Semiconductors

Duke, C.B.; Rice, M.J.; Steinrisser, F.

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Description

Title

Tunneling Measurement of Electron-Plasmon Interactions in Degenerate Semiconductors

Author(s)

• Duke, C.B.
• Rice, M.J.
• Steinrisser, F.

Issue Date

1969-06

Keyword(s)

• Tunneling
• Semiconductors
• Plasmon

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. R-420

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/74683

Sponsor(s)/Grant Number(s)

• Joint Services Electronics Program / DAAB-07-67-C-0199
• National Aeronautics and Space Administration / NaG 228-62

Owning Collections