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Academic Unit

College of Engineering 30
Coordinated Science Laboratory 15
Graduate Dissertations and Theses at Illinois 12
Dept. of Computer Science 9
Dept. of Electrical and Computer Engineering 6

Collection

Report - Coordinated Science Laboratory 15
Graduate Dissertations and Theses at Illinois 12
Dissertations and Theses - Computer Science 6
Dissertations and Theses - Electrical and Computer Engineering 6
Research and Tech Reports - Computer Science 3

Author(s)

Iyer, Ravishankar K. 5
Lee, Inhwan 4
Tang, Dong 3
Chen, Paul Peichuan 2
Choi, Gwan Seung 2
David, Francis M. 2
Kao, Wei-lun 2
Kim, Sungho 2
Li, Zhenmin 2
Natarajan, Chitra 2

Keyword(s)

Computer Science 11
Engineering, Electronics and Electrical 6
Fault tolerance 3
Data analysis 2
Dependability 2
Evaluation 2
Failure analysis 2
Fault injection 2
Fault-tolerance 2
Markov model 2

Type of Resource

text 30

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Showing 1–30 of 30 items

Thumbnail for Software dependability in the operational phase

Software dependability in the operational phase

Lee, Inhwan

Thumbnail for Measurement and Analysis of Operating System Fault Tolerance

Measurement and Analysis of Operating System Fault Tolerance

Lee, Inhwan; Tang, Dong; Iyer, Ravishankar K.

Thumbnail for Software Dependability in the Operational Phase

Software Dependability in the Operational Phase

Lee, Inhwan

Thumbnail for Software Dependability in the Operational Phase

Software Dependability in the Operational Phase

Lee, Inhwan

Thumbnail for DEPEND: A Design Environment for Prediction and Evaluation of System Dependability

DEPEND: A Design Environment for Prediction and Evaluation of System Dependability

Goswami, Kumar K.; Iyer, Ravishankar K.

Thumbnail for Measurement and Analysis of Failures in Computer Systems

Measurement and Analysis of Failures in Computer Systems

Thakur, Anshuman

Thumbnail for Confidence in Processor Array Outputs Under Periodic Application of Concurrent Error Detection

Confidence in Processor Array Outputs Under Periodic Application of Concurrent Error Detection

Chen, Paul P.; Mourad, Antoine N.; Fuchs, W. Kent

Thumbnail for Analysis of Large System Black-Box Test Data

Analysis of Large System Black-Box Test Data

Clapp, Kent C.; Iyer, Ravishankar K.

Thumbnail for Safety Implications of Robotic Surgery: A Study of 13 Years of FDA Data on da Vinci Surgical Systems

Safety Implications of Robotic Surgery: A Study of 13 Years of FDA Data on da Vinci Surgical Systems

Alemzadeh, Homa; Raman, Jai; Leveson, Nancy; Iyer, Ravishankar K.

Thumbnail for Failure Analysis and Modeling of a Multicomputer System

Failure Analysis and Modeling of a Multicomputer System

Subramani, Sujatha Srinivasan

Thumbnail for Reliability Models for Artificial Neural Networks

Reliability Models for Artificial Neural Networks

Natarajan, Chitra

Thumbnail for Experimental study of software dependability

Experimental study of software dependability

Kao, Wei-lun

Thumbnail for Experimental Study of Software Dependability

Experimental Study of Software Dependability

Kao, Wei-lun

Thumbnail for Improved Algorithms for Cell Placement and Their Parallel Implementations

Improved Algorithms for Cell Placement and Their Parallel Implementations

Kim, Sungho

Thumbnail for Improved Algorithms for Cell Placement and Their Parallel Implementations

Improved Algorithms for Cell Placement and Their Parallel Implementations

Kim, Sungho

Thumbnail for Periodic Application of Concurrent Error Detection in Processor Array Architectures

Periodic Application of Concurrent Error Detection in Processor Array Architectures

Chen, Paul Peichuan

Thumbnail for Building a Reliable Operating System

Building a Reliable Operating System

David, Francis M.

Thumbnail for A gate-level simulator for alpha-particle-induced transient faults

A gate-level simulator for alpha-particle-induced transient faults

Cha, Hungse

Thumbnail for Building a Reliable Operating System

Building a Reliable Operating System

David, Francis M.

Thumbnail for Fault-Sensitivity and Wear-Out Analysis of VLSI Systems

Fault-Sensitivity and Wear-Out Analysis of VLSI Systems

Choi, Gwan Seung

Thumbnail for Building a Reliable Operating System

Building a Reliable Operating System

David, Francis Manoj

Thumbnail for Periodic Application of Concurrent Error Detection in Processor Array Architectures

Periodic Application of Concurrent Error Detection in Processor Array Architectures

Chen, Paul Peichuan

Thumbnail for Measurement-Based Dependability Analysis and Modeling for Multicomputer Systems

Measurement-Based Dependability Analysis and Modeling for Multicomputer Systems

Tang, Dong

Thumbnail for Fault sensitivity and wear-out analysis of VLSI systems

Fault sensitivity and wear-out analysis of VLSI systems

Choi, Gwan Seung

Thumbnail for Experimental Analysis of Computer System Dependability

Experimental Analysis of Computer System Dependability

Iyer, Ravishankar K.; Tang, Dong

Thumbnail for Software and Hardware Techniques for Masking Security Vulnerabilities

Software and Hardware Techniques for Masking Security Vulnerabilities

Xu, Jun

Thumbnail for Using Data Mining Techniques to Improve Software Reliability

Using Data Mining Techniques to Improve Software Reliability

Li, Zhenmin

Thumbnail for An Environment for Imprecise Computations

An Environment for Imprecise Computations

Hull, David Lawrence

Thumbnail for Measurement-based performance analysis and modeling of parallel systems

Measurement-based performance analysis and modeling of parallel systems

Natarajan, Chitra

Thumbnail for Using Data Mining Techniques to Improve Software Reliability

Using Data Mining Techniques to Improve Software Reliability

Li, Zhenmin

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