Detailed analysis of the infrared spectrum of sif4: an update

Boudon, Vincent

Permalink

https://hdl.handle.net/2142/107363 Copy

Description

Title

Detailed analysis of the infrared spectrum of sif4: an update

Author(s)

Boudon, Vincent

Contributor(s)

Manceron, Laurent

Issue Date

2020-06-26

Keyword(s)

Atmospheric science

Abstract

\begin{wrapfigure}{r}{0pt} \includegraphics[scale=0.2]{Fig_nu4.eps} \end{wrapfigure} Silicon tetrafluoride (SiF$_4$) should be a normal trace component of volcanic gases. However, a better knowledge of spectroscopic parameters is needed for this molecule in order to derive accurate concentrations. As explained last year, we undertook an extensive high-resolution study of its infrared absorption bands, for the there isotopologues in natural abundance: ${}^{28}$SiF$_4$ (92.23~\%), ${}^{29}$SiF$_4$ (4.67~\%) and ${}^{30}$SiF$_4$ (3.10~\%). We present here an update of this study. It includes a new global fit with consistent parameter sets for the ground and excited states (the Figure on the right presents the $\nu_4$ bending fundamental region). In particular, all existing rotational line data have been included. The $2\nu_4$ band of ${}^{28}$SiF$_4$ could also be analyzed in detail. A first rough estimates of the dipole moment derivative for the $\nu_3$ band has been performed, leading to to an integrated band intensity which is consistent with literature values, around $680$~km$/$mol. The isotopic dependance of band centers and Coriolis parameters has been studied, thanks to the formula presented in talk P4363.

Publisher

International Symposium on Molecular Spectroscopy

Type of Resource

Text

Language

eng

Permalink

http://hdl.handle.net/2142/107363

Copyright and License Information

Copyright 2020 is held by the Author(s)

Owning Collections